High-Speed Measurements
The 4263B can boost throughput with a measurement speed of 25 ms at any test frequency. This ability improves the throughput of electrolytic capacitor and transformer testing. The 4263B can check the contact condition between the test terminals and the device-under-test (DUT). This function ensures the reliability of PASS/FAIL testing with automatic handlers in production. The quick recovery system of the 4263B improves throughput. Normal operation is resumed the instant a faulty DUT is removed from the handler, so the handler can always be operated at its full
